• DocumentCode
    3748099
  • Title

    Oxide thin film transistor technology: Capturing device-circuit interactions

  • Author

    Arokia Nathan;Sungsik Lee;Sanghun Jeon;Reza Chaji

  • Author_Institution
    Electrical Engineering Div, Engineering Dept, Cambridge University, Cambridge CB3 0FA, UK
  • fYear
    2015
  • Abstract
    This paper presents the current status of oxide semiconductor technology for applications ranging from interactive displays to imaging systems with a strong focus on device-circuit interaction to compensate for material weaknesses and issues related to non-uniformity, instability, and persistent photoconductivity.
  • Keywords
    "Thin film transistors","Photoconductivity","Semiconductor device measurement","Organic light emitting diodes","Wavelength measurement","Logic gates","Imaging"
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2015 IEEE International
  • Electronic_ISBN
    2156-017X
  • Type

    conf

  • DOI
    10.1109/IEDM.2015.7409643
  • Filename
    7409643
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3748099