Title :
Oxide thin film transistor technology: Capturing device-circuit interactions
Author :
Arokia Nathan;Sungsik Lee;Sanghun Jeon;Reza Chaji
Author_Institution :
Electrical Engineering Div, Engineering Dept, Cambridge University, Cambridge CB3 0FA, UK
Abstract :
This paper presents the current status of oxide semiconductor technology for applications ranging from interactive displays to imaging systems with a strong focus on device-circuit interaction to compensate for material weaknesses and issues related to non-uniformity, instability, and persistent photoconductivity.
Keywords :
"Thin film transistors","Photoconductivity","Semiconductor device measurement","Organic light emitting diodes","Wavelength measurement","Logic gates","Imaging"
Conference_Titel :
Electron Devices Meeting (IEDM), 2015 IEEE International
Electronic_ISBN :
2156-017X
DOI :
10.1109/IEDM.2015.7409643
