DocumentCode :
3748117
Title :
26.5 Terahertz electrically triggered RF switch on epitaxial VO2-on-Sapphire (VOS) wafer
Author :
H. Madan;H-T. Zhang;M. Jerry;D. Mukherjee;N. Alem;R. Engel-Herbert;S. Datta
Author_Institution :
The Pennsylvania State University, University Park, Pennsylvania 16802, United States
fYear :
2015
Abstract :
An electrically triggered VO2 RF switch with a record switching cut off frequency (FCO) of 26.5THz was demonstrated. The switch exhibits an isolation better than 35dB and a low 0.5dB insertion loss up-to 50GHz. The switch features a highly linear response with 1-dB compression point (PidB) better than 12dBm and output third-order intercept point (OIP3) better than 44dBm. The fast insulator to metal-transition (IMT) of the VO2 enables the switch to have an electrical-turn on delay of less than 25ns.
Keywords :
"Switches","Radio frequency","Temperature measurement","Solids","Switching circuits","Conductivity","Films"
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2015 IEEE International
Electronic_ISBN :
2156-017X
Type :
conf
DOI :
10.1109/IEDM.2015.7409661
Filename :
7409661
Link To Document :
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