• DocumentCode
    3748123
  • Title

    Demonstration of 3D vertical RRAM with ultra low-leakage, high-selectivity and self-compliance memory cells

  • Author

    Qing Luo;Xiaoxin Xu;Hongtao Liu;Hangbing Lv;Tiancheng Gong;Shibing Long;Qi Liu;Haitao Sun;Writam Banerjee;Ling Li;Jianfeng Gao;Nianduan Lu;Steve S. Chung;Jing Li;Ming Liu

  • Author_Institution
    Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China
  • fYear
    2015
  • Abstract
    Developing high performance self-selective cell (SSC) is one of the most critical issues of the integration of 3D vertical RRAM (V-RRAM). In this work, a four-layer V-RRAM array, with high performance HfO2/mixed ionic and electronic conductor (MIEC) bilayer SSC, was demonstrated for the first time. Several salient features were achieved, including ultra-low half-select leakage (<;0.1 pA), very high nonlinearity (>103), low operation current (nA level), self-compliance, high endurance (>107), and robust read/write disturbance immunity.
  • Keywords
    "Three-dimensional displays","Resistance","Hafnium compounds","Optical switches","Leakage currents","Tin"
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2015 IEEE International
  • Electronic_ISBN
    2156-017X
  • Type

    conf

  • DOI
    10.1109/IEDM.2015.7409667
  • Filename
    7409667