DocumentCode :
3748171
Title :
SiC- and GaN-based power devices: Technologies, products and applications
Author :
S. Coffa;M. Saggio;A. Patti
Author_Institution :
STMicroelectronics, Stradale Primosole 50, 95121 Catania (Italy)
fYear :
2015
Abstract :
Compound semiconductors (and mainly at the moment SiC and GaN) power devices have practically shown a quantum leap in the performances of power devices and the possibility to enlarge the use of power electronics at very high voltages, high temperature and high power. However, the status of SiC and GaN devices today is much less mature than that of Si power devices in terms of manufacturability, material quality, process control, cost and reliability. In this paper activities on SiC and GaN power devices at STMicroelectronics will be presented and the perspectives of a large adoption of compound semiconductors power devices highlighted.
Keywords :
"Silicon carbide","Gallium nitride","MOSFET","Performance evaluation","Switches","Semiconductor device reliability"
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2015 IEEE International
Electronic_ISBN :
2156-017X
Type :
conf
DOI :
10.1109/IEDM.2015.7409715
Filename :
7409715
Link To Document :
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