• DocumentCode
    3748171
  • Title

    SiC- and GaN-based power devices: Technologies, products and applications

  • Author

    S. Coffa;M. Saggio;A. Patti

  • Author_Institution
    STMicroelectronics, Stradale Primosole 50, 95121 Catania (Italy)
  • fYear
    2015
  • Abstract
    Compound semiconductors (and mainly at the moment SiC and GaN) power devices have practically shown a quantum leap in the performances of power devices and the possibility to enlarge the use of power electronics at very high voltages, high temperature and high power. However, the status of SiC and GaN devices today is much less mature than that of Si power devices in terms of manufacturability, material quality, process control, cost and reliability. In this paper activities on SiC and GaN power devices at STMicroelectronics will be presented and the perspectives of a large adoption of compound semiconductors power devices highlighted.
  • Keywords
    "Silicon carbide","Gallium nitride","MOSFET","Performance evaluation","Switches","Semiconductor device reliability"
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2015 IEEE International
  • Electronic_ISBN
    2156-017X
  • Type

    conf

  • DOI
    10.1109/IEDM.2015.7409715
  • Filename
    7409715