DocumentCode :
3748284
Title :
III-Nitride transistors with photonic-ohmic drain for enhanced dynamic performances
Author :
Xi Tang;Baikui Li;Yunyou Lu;Hanxing Wang;Cheng Liu;Jin Wei;Kevin J. Chen
Author_Institution :
Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Hong Kong
fYear :
2015
Abstract :
Development of III-nitride high-voltage power devices is still challenged by deep traps that are inevitable in state-of-the-art AlGaN/GaN-on-Si epitaxial heterostructures. In this work, we report a heterojunction field-effect transistor featuring a photonic-ohmic drain, i.e. PODFET, on conventional AlGaN/GaN-on-Si power electronics platform. Photons are synchronously generated with the switching channel current, and they are capable of effectively pumping electrons from the deep surface/bulk traps during each switching cycle. Consequently, the dynamic ON-resistance of the PODFET is significantly reduced compared to that of a conventional ohmic-drain FET.
Keywords :
"Photonics","Switches","Electron traps","Aluminum gallium nitride","Wide band gap semiconductors","HEMTs","Resistance"
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2015 IEEE International
Electronic_ISBN :
2156-017X
Type :
conf
DOI :
10.1109/IEDM.2015.7409832
Filename :
7409832
Link To Document :
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