DocumentCode :
3748456
Title :
Discriminative Learning of Deep Convolutional Feature Point Descriptors
Author :
Edgar Simo-Serra;Eduard Trulls;Luis Ferraz;Iasonas Kokkinos;Pascal Fua;Francesc Moreno-Noguer
Author_Institution :
Waseda Univ., Tokyo, Japan
fYear :
2015
Firstpage :
118
Lastpage :
126
Abstract :
Deep learning has revolutionalized image-level tasks such as classification, but patch-level tasks, such as correspondence, still rely on hand-crafted features, e.g. SIFT. In this paper we use Convolutional Neural Networks (CNNs) to learn discriminant patch representations and in particular train a Siamese network with pairs of (non-)corresponding patches. We deal with the large number of potential pairs with the combination of a stochastic sampling of the training set and an aggressive mining strategy biased towards patches that are hard to classify. By using the L2 distance during both training and testing we develop 128-D descriptors whose euclidean distances reflect patch similarity, and which can be used as a drop-in replacement for any task involving SIFT. We demonstrate consistent performance gains over the state of the art, and generalize well against scaling and rotation, perspective transformation, non-rigid deformation, and illumination changes. Our descriptors are efficient to compute and amenable to modern GPUs, and are publicly available.
Keywords :
"Training","Three-dimensional displays","Measurement","Computer architecture","Computer vision","Computational modeling","Semantics"
Publisher :
ieee
Conference_Titel :
Computer Vision (ICCV), 2015 IEEE International Conference on
Electronic_ISBN :
2380-7504
Type :
conf
DOI :
10.1109/ICCV.2015.22
Filename :
7410379
Link To Document :
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