• DocumentCode
    3749045
  • Title

    Electrogram coupling as a measure of local conduction during atrial fibrillation

  • Author

    Stef Zeemering;Piotr Podziemski;Arne van Hunnik;Bart Maesen;Pietro Bonizzi;Ulrich Schotten

  • Author_Institution
    Department of Physiology, Maastricht University, The Netherlands
  • fYear
    2015
  • Firstpage
    813
  • Lastpage
    816
  • Abstract
    Epicardial wavefront conduction patterns during atrial fibrillation (AF) can be recorded using high-density contact mapping. Quantification of electrogram morphology similarity at adjacent recording sites during AF may characterize substrate complexity without the need for electrogram annotation. Electrogram coupling was quantified as the decay in reconstruction quality of a central electrogram by its neighbors at increasing distance. Coupling was computed in patients in paroxysmal AF (PAF, n=12) and persistent AF (persAF, n=9) with a 16 ×16 grid of electrodes (1.5mm electrode distance) with nonnegative least squares using only complete, symmetric topologies. Half-decay distance c0.5 was compared to conventional conduction-related contact mapping parameters. Electrogram coupling was weaker in persAF than in PAF (c0.5 (median±MAD): 2.4±0.5mm vs. 3.2±1.2mm, p<;0.02). High correlation was found between mean c0.5 and CV (ρ=0.80, p<;0.001). Other parameters showed only moderate or no correlation. Differences in AF conduction velocity between patients can be accurately described using a surrogate parameter based on the degree of electrogram coupling. This technique can for instance be applied to high-density contact recordings to quickly assess the Class I effect of antiarrhythmic drugs, both in atrial and ventricular recordings.
  • Keywords
    "Electrodes","Couplings","Complexity theory","Correlation","Substrates","Topology","Physiology"
  • Publisher
    ieee
  • Conference_Titel
    Computing in Cardiology Conference (CinC), 2015
  • ISSN
    2325-8861
  • Print_ISBN
    978-1-5090-0685-4
  • Electronic_ISBN
    2325-887X
  • Type

    conf

  • DOI
    10.1109/CIC.2015.7411035
  • Filename
    7411035