• DocumentCode
    374932
  • Title

    Comparison of common mode impedance measurements using 2 current probe technique versus V/I technique for CISPR 22 conducted emissions measurements

  • Author

    Haarlacher, B.L. ; Stewart, Richard W.

  • Author_Institution
    Fischer Custom Commun. Inc, San Diego, CA, USA
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    17
  • Abstract
    CISPR 22 (1997) defines the conducted emissions requirements and testing of information technology equipment (ITE). Section C.1.4 of CISPR 22 requires measuring the common mode impedance of an ITE cable bundle with respect to its ground plane, and provides a test methodology for this measurement. This paper presents and compares the results of measuring the common mode impedance using (1) the 2 current probe method cited in Section C.1.4 of CISPR 22 (1997), and (2) using a current probe and a capacitive voltage probe. Results are presented for different wire (cable bundle) lengths and for different load impedances on the wire. The results show that the 2 current probe method can lead to significant impedance measurement errors, and that the current/voltage probe method provides more accurate impedance measurements that are also not adversely influenced by the wire length
  • Keywords
    cables (electric); capacitive sensors; electric current measurement; electric impedance measurement; electric noise measurement; electromagnetic interference; electronic equipment testing; measurement errors; probes; voltage measurement; 2 current probe technique; CISPR 22 conducted emissions measurements; V/I technique; cable bundle; capacitive voltage probe; common mode impedance measurements; conducted emissions requirements; conducted emissions testing; current probe; impedance measurement errors; information technology equipment; load impedances; Communication cables; Current measurement; Ferrites; Impedance measurement; Performance evaluation; Probes; Size measurement; Testing; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    0-7803-6569-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2001.950511
  • Filename
    950511