• DocumentCode
    374933
  • Title

    Common mode voltage measurements comparison for CISPR 22 conducted emissions measurements

  • Author

    Harlacher, Bruce L. ; Stewart, Richard W.

  • Author_Institution
    Fischer Custom Commun. Inc., San Diego, CA, USA
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    26
  • Abstract
    CISPR 22 (1997) requires the measurement of common mode voltages on Information Technology Equipment (ITE) cabling to determine conducted emission levels over the 150 kHz to 30 MHz range. This paper presents and compares the results of measuring the common mode voltage on a simulated cable bundle using (1) a capacitive (noncontact) voltage probe, and (2) using a capacitive injection clamp in conjunction with a low capacitance FET voltage probe. Results are presented for the common mode voltage measurements made with both methods at different physical locations on the simulated cable bundle. The results show that it is important to have a well controlled common mode impedance, and to make the voltage measurement at that well controlled point. Failure to have a well controlled impedance can result in voltage standing waves, leading to significant voltage measurement errors. Results are also provided that show the capacitive clamp/FET voltage probe combination exceed the 5 pF capacitive loading limit to the cable under test as specified by CISPR 22
  • Keywords
    cables (electric); capacitive sensors; electric impedance; electric noise measurement; electric variables control; electromagnetic interference; field effect transistors; probes; voltage measurement; 150 kHz to 30 MHz; CISPR 22 (1997); cable under test; capacitive clamp/FET voltage probe combination; capacitive injection clamp; capacitive voltage probe; common mode voltages measurement; conducted emission levels; controlled common mode impedance; information technology equipment; low capacitance FET voltage probe; measurement errors; noncontact voltage probe; simulated cable bundle; voltage standing waves; Capacitance measurement; Clamps; Error correction; FETs; Impedance; Information technology; Low voltage; Probes; Voltage control; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    0-7803-6569-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2001.950516
  • Filename
    950516