• DocumentCode
    3749427
  • Title

    Kinetics of ionic migration and relaxation in anodic oxide films

  • Author

    V.P. Parkhutik;V.I. Shershulskij;V.A. Labunov

  • Author_Institution
    Minsk Radioengineering Inst., P.Brovki st. 6, 220069, USSR
  • fYear
    1983
  • fDate
    7/1/1983 12:00:00 AM
  • Firstpage
    40
  • Lastpage
    44
  • Abstract
    Anodic oxide films (AOF) grown on the surface of metals and semiconductors are widely used in various spheres of technology. Although such well-known features of AOF as space charge accumulation, electret effect, thermal instability etc. have attracted much research, their real nature is far from being clearly understood.
  • Keywords
    "Aging","Metals"
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, Proceedings of First International Conference on
  • Type

    conf

  • DOI
    10.1109/ICSD.1983.7411479
  • Filename
    7411479
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3749427