• DocumentCode
    3749469
  • Title

    Fluctuations as a basis for the Weibull statistics of dielectric breakdown

  • Author

    R. M. Hill;L. A. Dissado

  • Author_Institution
    The Dielectrics Group, Chelsea College, University of London, SW6 5PR, England
  • fYear
    1983
  • fDate
    7/1/1983 12:00:00 AM
  • Firstpage
    286
  • Lastpage
    290
  • Abstract
    A theoretical justification for the use of Weibull statistics in breakdown studies has been derived and has been applied to breakdown data on thin film samples. In general it has been found that the data for electrical breakdown in bulk samples is insufficient to allow a similar statistical analysis.
  • Keywords
    Presses
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, Proceedings of First International Conference on
  • Type

    conf

  • DOI
    10.1109/ICSD.1983.7411522
  • Filename
    7411522
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3749469