DocumentCode
3749471
Title
Applications and implications of Weibull statistics in dielectrics
Author
J.C. Fothergill;R.M. Hill;L.A. Dissado;S.V. Wolfe
Author_Institution
Cables and Engineering Division, Standard Telecommunication Laboratories Ltd., London Road, Harlow, Essex, CM17 9NA, U.K.
fYear
1983
fDate
7/1/1983 12:00:00 AM
Firstpage
291
Lastpage
295
Abstract
It is shown that a complete equivalence exists between static and dynamic methods of breakdown testing. Some preliminary experimental results lend support to the Hill and Dissado theory of a fluctuation controlled breakdown mechanism.
Keywords
"Dielectric loss measurement","Frequency measurement","Stress","Irrigation","Electric breakdown","Power cables","Cable insulation"
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Solid Dielectrics, Proceedings of First International Conference on
Type
conf
DOI
10.1109/ICSD.1983.7411524
Filename
7411524
Link To Document