• DocumentCode
    374949
  • Title

    EUT directivity and other uncertainty considerations for GHz-range use of TEM waveguides

  • Author

    Harrington, Timothy E. ; Bronaugh, E.L.

  • Author_Institution
    Texas Univ., Arlington, TX, USA
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    117
  • Abstract
    Over the past several years, there has been an increasing trend to identify and minimize measurement uncertainties in most types of EMC testing. This paper describes various uncertainty influence quantities that may affect direct voltage-based or correlated E-field radiated emissions tests in most TEM waveguides, and specifically in the GTEM cell. Most TEM-waveguide emissions testing is based on the measurement of EUT total radiated power. To clarify directivity and EUT loading influences, total radiated power and field strengths measured from canonical loop antenna and slotted and raised-lid box EUTs in GTEM cells in the 30-2000 MHz frequency range is presented. Measured results from various GTEM multi-position conversion-to-free-space or -OATS schemes are compared. The intent is to describe an analysis framework and raise awareness so that operators can begin to recognize and minimize uncertainty sources, and to contribute to better understanding of correlation effects in GTEM
  • Keywords
    electromagnetic compatibility; electromagnetic interference; electronic equipment testing; loop antennas; measurement uncertainty; test facilities; waveguide theory; 30 to 2000 MHz; E-field radiated emissions tests; EMC testing; EUT; GTEM cell; GTEM multi-position conversion-to-free-space schemes; OATS; TEM waveguides; canonical loop antenna; correlation effects; equipment-under-test; measurement uncertainties; raised-lid box EUTs; slotted-lid box EUTs; total radiated power; uncertainty influence quantities; uncertainty sources; Antenna measurements; Electromagnetic compatibility; Frequency measurement; Loaded antennas; Measurement uncertainty; Power measurement; Slot antennas; TEM cells; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    0-7803-6569-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2001.950559
  • Filename
    950559