• DocumentCode
    3749631
  • Title

    Non-exchanging structure calibration kit for double-side direct contact measurement

  • Author

    Han-Hsiang Shih;Meng-Hua Tu;Sung-Mao Wu

  • Author_Institution
    Micro Electronic Packaging Laboratory, Department of Electrical Engineering, National University of Kaohsiung, Taiwan
  • Volume
    1
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In this paper, there is a novel double-side calibration thru kits which can be used in 4 ports By comparing different double-sided calibration, novel double-side calibration has better advantages. Therefore, novel double-side calibration is used in this paper. In novel double-side SOLT calibration, thru kit is the most important part. There are two types design about novel double-side thru kit, one is called the paralleled, the other is the diagonal. Finally, non-exchanged layer structure to achieve what we design.
  • Keywords
    "Calibration","Microwave technology","Decision support systems","Coplanar waveguides","Indexes","Delays"
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (APMC), 2015 Asia-Pacific
  • Print_ISBN
    978-1-4799-8765-8
  • Type

    conf

  • DOI
    10.1109/APMC.2015.7411700
  • Filename
    7411700