• DocumentCode
    3749666
  • Title

    Development of near field detecting probe by optoelectronic elements

  • Author

    Ming-Yang Huang;Shao-Nan Hong;Sung-Mao Wu

  • Author_Institution
    Micro Electronic Packaging Laboratory, Department of Electrical Engineering, National University of Kaohsiung, Taiwan
  • Volume
    1
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper introduces a probe in particular for near field measurements of electric field and magnetic field. It has a very tiny size about 1×1×1 cm3. The photoelectric power supply and optical signal transmission make it have smallest field distortion. It enables measurements both in the time and frequency domain. Due to standard far field measurements needs a standard and an expensive system. We can utilize this probe to measure the electromagnetic fields of electronic circuit when it is working. Then we can use specific theories to transform the near field measurements into far field.
  • Keywords
    "Distortion measurement","Magnetic field measurement","Probes","Optical distortion","Standards","Electric variables measurement","Electric fields"
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (APMC), 2015 Asia-Pacific
  • Print_ISBN
    978-1-4799-8765-8
  • Type

    conf

  • DOI
    10.1109/APMC.2015.7411736
  • Filename
    7411736