DocumentCode :
3749666
Title :
Development of near field detecting probe by optoelectronic elements
Author :
Ming-Yang Huang;Shao-Nan Hong;Sung-Mao Wu
Author_Institution :
Micro Electronic Packaging Laboratory, Department of Electrical Engineering, National University of Kaohsiung, Taiwan
Volume :
1
fYear :
2015
Firstpage :
1
Lastpage :
3
Abstract :
This paper introduces a probe in particular for near field measurements of electric field and magnetic field. It has a very tiny size about 1×1×1 cm3. The photoelectric power supply and optical signal transmission make it have smallest field distortion. It enables measurements both in the time and frequency domain. Due to standard far field measurements needs a standard and an expensive system. We can utilize this probe to measure the electromagnetic fields of electronic circuit when it is working. Then we can use specific theories to transform the near field measurements into far field.
Keywords :
"Distortion measurement","Magnetic field measurement","Probes","Optical distortion","Standards","Electric variables measurement","Electric fields"
Publisher :
ieee
Conference_Titel :
Microwave Conference (APMC), 2015 Asia-Pacific
Print_ISBN :
978-1-4799-8765-8
Type :
conf
DOI :
10.1109/APMC.2015.7411736
Filename :
7411736
Link To Document :
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