DocumentCode
3749666
Title
Development of near field detecting probe by optoelectronic elements
Author
Ming-Yang Huang;Shao-Nan Hong;Sung-Mao Wu
Author_Institution
Micro Electronic Packaging Laboratory, Department of Electrical Engineering, National University of Kaohsiung, Taiwan
Volume
1
fYear
2015
Firstpage
1
Lastpage
3
Abstract
This paper introduces a probe in particular for near field measurements of electric field and magnetic field. It has a very tiny size about 1×1×1 cm3. The photoelectric power supply and optical signal transmission make it have smallest field distortion. It enables measurements both in the time and frequency domain. Due to standard far field measurements needs a standard and an expensive system. We can utilize this probe to measure the electromagnetic fields of electronic circuit when it is working. Then we can use specific theories to transform the near field measurements into far field.
Keywords
"Distortion measurement","Magnetic field measurement","Probes","Optical distortion","Standards","Electric variables measurement","Electric fields"
Publisher
ieee
Conference_Titel
Microwave Conference (APMC), 2015 Asia-Pacific
Print_ISBN
978-1-4799-8765-8
Type
conf
DOI
10.1109/APMC.2015.7411736
Filename
7411736
Link To Document