Title :
Efficient and accurate testing of an EMC compliance chamber using an ultrawideband measurement system
Author :
Johnk, Robert T. ; Novotny, David R. ; Weil, Claude M. ; Taylor, Michael ; Hara, Tony J O
Author_Institution :
RF Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
This paper summarizes a joint NIST-Industry measurement effort. The purpose of this effort was to use a NIST-developed ultrawideband measurement system to assess the performance improvement of a ferrite tile anechoic chamber after a partial retrofit. Measurements were performed in the 30-1200 MHz frequency range before and after treatments were applied and excellent results were obtained. The system exhibited good sensitivity and the results highlight the effects of various retrofitting treatments. The effort also demonstrates that the NIST ultra wideband system is an efficient tool for the evaluation for both current and proposed anechoic EMC compliance test chambers
Keywords :
anechoic chambers (electromagnetic); electromagnetic compatibility; ferrites; network analysers; signal processing; testing; 30 to 1200 MHz; NIST developed ultrawideband measurement system; NIST-industry measurement effort; anechoic EMC compliance test chambers; ferrite tile anechoic chamber; figure of merit; partial retrofit; performance improvement; performance metric; signal processing; site attenuation; time-domain; vector network analyzer; Attenuation; Electromagnetic compatibility; Ferrites; Frequency; Horn antennas; NIST; Pollution measurement; Testing; Tiles; Ultra wideband technology;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950642
