Title :
Introduction to near-field techniques for EMC applications: state of the art and prospectives
Author :
Bolomey, Jean-Charles
Author_Institution :
Electromagn. Dept., Supelec, Gif-sur-Yvette, France
Abstract :
An overview of the expected increasing importance of the near-field in EMC is given. Some examples are provided to illustrate how antenna near-field techniques can be extended to EMC testing
Keywords :
antenna testing; electromagnetic compatibility; EMC applications; EMC testing; antenna near-field techniques; antenna testing; state of the art; Antenna measurements; Carbon capture and storage; Coupling circuits; Electromagnetic compatibility; Frequency; Measurement standards; Noise measurement; Particle measurements; Phased arrays; Testing;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950662
