DocumentCode
374979
Title
Introduction to near-field techniques for EMC applications: state of the art and prospectives
Author
Bolomey, Jean-Charles
Author_Institution
Electromagn. Dept., Supelec, Gif-sur-Yvette, France
Volume
1
fYear
2001
fDate
2001
Abstract
An overview of the expected increasing importance of the near-field in EMC is given. Some examples are provided to illustrate how antenna near-field techniques can be extended to EMC testing
Keywords
antenna testing; electromagnetic compatibility; EMC applications; EMC testing; antenna near-field techniques; antenna testing; state of the art; Antenna measurements; Carbon capture and storage; Coupling circuits; Electromagnetic compatibility; Frequency; Measurement standards; Noise measurement; Particle measurements; Phased arrays; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location
Montreal, Que.
Print_ISBN
0-7803-6569-0
Type
conf
DOI
10.1109/ISEMC.2001.950662
Filename
950662
Link To Document