Title :
Qualification of a ceria slurry reclaim system for shallow trench isolation polish in high volume manufacturing
Author :
Tito Tang;Pete Beckage;Greg Westhauser;Clayton Judd;Allen Evans;Larry Kuehn;Bret Rhea;Alejandro Guerra;Greg Goodwin;Brad Yellitz;Franz Brummer;Andreas Wunderlich;Scott Ray
Author_Institution :
Cypress Semiconductor, Fab25, M/S 608, 5204 E. Ben White Blvd, Austin, TX 78730, USA
Abstract :
Ceria slurry used for polishing semiconductor wafers at the shallow trench isolation step has become very expensive. To help reduce wafer processing costs, a ceria slurry recycling process was developed using a reclaim unit from HighQ-Factory. Product wafers polished with a blend of the concentrated spent slurry and virgin ceria slurry produced equivalent post polish silicon nitride and oxide thicknesses to the standard 2-step, 2-slurry process. Microscratch defects were also reduced by 35% compared to wafers polished with the standard process. Based on the blending ratio, slurry costs were reduced by >50%.
Keywords :
"Slurries","Recycling","Silicon compounds","Solids","Standards","Production","Silicon"
Conference_Titel :
Planarization/CMP Technology (ICPT), 2015 International Conference on