Title :
Numerical modeling of digital devices impact on EMC/EMI
Author :
Canavero, F. ; Grivet-Talocia, S. ; Maio, I. ; Stievano, I.
Author_Institution :
Dipt. Elettronica, Politecnico di Torino, Italy
Abstract :
One of the most important issues for the assessment of EMI/EMC of modern electronic systems is the characterization of fast switching digital devices. Their nonlinear behavior strongly affects the integrity of signals launched on system interconnects, which in turn affect crosstalk and radiation. The system-level EMC is therefore highly sensitive to the nonlinear behavior of individual IC ports, which must be accounted for in any realistic numerical model. This paper considers several simplified approaches for modeling digital IC ports, with the aim of detecting which are the most important effects that must be considered for both signal integrity and radiated emission analyses
Keywords :
crosstalk; digital integrated circuits; electromagnetic compatibility; electromagnetic interference; integrated circuit interconnections; integrated circuit modelling; nonlinear dynamical systems; piecewise linear techniques; switching circuits; EMC; EMI; crosstalk; digital IC ports; electronic systems; equivalent circuits; fast switching digital devices; individual IC ports; linear models; nonlinear behavior; nonlinear dynamic models; piecewise linear models; radiated emission analysis; radiation; signals integrity; system interconnects; Crosstalk; Digital integrated circuits; Driver circuits; Electromagnetic compatibility; Electromagnetic interference; Integrated circuit modeling; Numerical models; Power system transients; Semiconductor device modeling; Signal analysis;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950709
