DocumentCode :
3750200
Title :
Interfacial reaction and reliability of high temperature die attach solders for power electronics
Author :
Lee Jong Bum;Hwang How Yuan;Pan Wei Chih;Rhee Min Woo Daniel
Author_Institution :
Institute of Microelectronics, A?STAR (Agency for Science, Technology and Research) 11 Science Park Rd, Singapore Science Park II, Singapore 117685
fYear :
2015
Firstpage :
1
Lastpage :
5
Abstract :
Lead-free solder alloys for high temperature applications is required to meet increasing demands for reliable replacements for lead-based alloys. Especially, high temperature solder is required for bonding in power electronics packages where first bonding on a lead-frame is performed at a temperature of about 330 °C. In this study, the SiC based TO-220 power package was developed by applying high temperature endurable material sets which can endure over 220°C device junction temperature. The interfacial reaction and reliability of SiC die attachment on and Ni plated lead frames using Zn-Al based solder was investigated. Zn-Al-Ge solder alloy showed good temperature tolerance after temperature cycle (TC), high temperature storage test whereas Zn-Al-Ge-Mg solder alloy showed failures after TC test.
Keywords :
"High-temperature superconductors","Image edge detection","Reliability","Lead","Silicon carbide","Bonding"
Publisher :
ieee
Conference_Titel :
Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
Type :
conf
DOI :
10.1109/EPTC.2015.7412304
Filename :
7412304
Link To Document :
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