Title :
Thermal resistance measurement of discrete capacitors
Author :
Zoltan Sarkany;Gabor Farkas;Marta Rencz
Author_Institution :
Mentor Graphics Corporation, Budapest, Hungary
Abstract :
Not only the active devices are affected by the generated power in electronics but capacitors also suffer from the elevated temperature levels. This paper attempts transferring the concepts of the thermal transient measurement method used in the semiconductor characterization to capacitor components. We show how temperature dependent electrical parameters could be used to measure the temperature of capacitors and also discuss the key requirements against the measurement setup.
Keywords :
"Temperature measurement","Capacitors","Temperature dependence","Semiconductor device measurement","Temperature","Capacitance","Temperature sensors"
Conference_Titel :
Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
DOI :
10.1109/EPTC.2015.7412332
