DocumentCode
3750243
Title
Solder paste corrosivity assesment: Bono test
Author
C?line Puechagut;Anne-Marie La?gt;Emmanuelle Gu?n?;Richard Anisko
Author_Institution
Inventec Performance Chemicals, Rue des Coulons BP 27, Cour de la Gare de Marchandises 94363 Bry Sur Marne, France
fYear
2015
Firstpage
1
Lastpage
8
Abstract
Lead free soldering with no clean solder pastes represent nowadays the most common process in electronic assembly. A solder paste is usually considered as no-clean if it passes all IPC J-STD-004 corrosion tests: copper mirror, copper panel corrosion test, Surface Insulation Resistance (SIR) and Elecrochemical Migration (ECM). Other SIR and ECM tests are described in Bellcore GR-78-CORE and JIS Z3197 standards. Although SIR and ECM tests are recognized by all standards authorities to evaluate the solder paste residue corrosivity after reflow, a more selective method, the Bono test, has been developed and implemented in some French companies as a qualification criterion. It has been proven that compared to common corrosion tests, the Bono test better differentiates the nature of solder paste residues.
Keywords
"Corrosion","Electronic countermeasures","Coatings","Copper","Nitrogen","Temperature measurement","Electronics packaging"
Publisher
ieee
Conference_Titel
Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
Type
conf
DOI
10.1109/EPTC.2015.7412347
Filename
7412347
Link To Document