• DocumentCode
    3750243
  • Title

    Solder paste corrosivity assesment: Bono test

  • Author

    C?line Puechagut;Anne-Marie La?gt;Emmanuelle Gu?n?;Richard Anisko

  • Author_Institution
    Inventec Performance Chemicals, Rue des Coulons BP 27, Cour de la Gare de Marchandises 94363 Bry Sur Marne, France
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Lead free soldering with no clean solder pastes represent nowadays the most common process in electronic assembly. A solder paste is usually considered as no-clean if it passes all IPC J-STD-004 corrosion tests: copper mirror, copper panel corrosion test, Surface Insulation Resistance (SIR) and Elecrochemical Migration (ECM). Other SIR and ECM tests are described in Bellcore GR-78-CORE and JIS Z3197 standards. Although SIR and ECM tests are recognized by all standards authorities to evaluate the solder paste residue corrosivity after reflow, a more selective method, the Bono test, has been developed and implemented in some French companies as a qualification criterion. It has been proven that compared to common corrosion tests, the Bono test better differentiates the nature of solder paste residues.
  • Keywords
    "Corrosion","Electronic countermeasures","Coatings","Copper","Nitrogen","Temperature measurement","Electronics packaging"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
  • Type

    conf

  • DOI
    10.1109/EPTC.2015.7412347
  • Filename
    7412347