• DocumentCode
    3750260
  • Title

    Impact of different developer concentrations for advanced packaging photolithography

  • Author

    Serine Soh Siew Boon;Sek Soon Ann;King Jien Chui;Mingbin Yu

  • Author_Institution
    Institute of Microelectronics, A?STAR (Agency of Science, Technology and Research) 11 Science Park Road, Singapore Science Park2, Singapore 117685
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Enhancement of developing effect with Tetramethylammonium hydroxide (TMAH) of different concentration beneficially enhances the contour effect of Photo-resist (PR) after development. Tetramethylammonium hydroxide (TMAH) of different concentration is used to evaluate the developing effect on different photo-resist with different thicknesses and critical dimensions. Fabricated with similar patterned wafers; wall profiles and thickness measurement were compared at post development. Volume of developer applied denotes the reduction in chemical consumption and cycle time reduction.
  • Keywords
    "Thickness measurement","Lithography","Productivity","Chemicals","Resists","Coatings","Dielectrics"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
  • Type

    conf

  • DOI
    10.1109/EPTC.2015.7412364
  • Filename
    7412364