Title :
March test and on-chip test circuit of flash memories
Author :
Ko, Jiun-Nan ; Huang, Jing-Reng ; Chang, Tsin-Yuan
Author_Institution :
Dept. of Electr. Eng., Nat. Tsinghua Univ., Beijing, China
Abstract :
A March test, namely "March Flash" and an on-chip test circuit are presented to detect all single functional fault model with only 4 elements to gain 100% fault coverage and to detect all the parametric faults, respectively. These two methods can be integrated to solve the testing problems of NAND- and NOR- type flash memories. With the hardware penalty of a 3- or 4-bit counter, test of a flash memory can be achieved in few seconds by adopting these proposed test strategies
Keywords :
NAND circuits; NOR circuits; flash memories; integrated circuit testing; March Flash; March test algorithm; NAND circuit; NOR circuit; counter; fault coverage; flash memory; hardware penalty; on-chip test circuit; parametric fault detection; single functional fault model; Circuit faults; Circuit testing; Counting circuits; Electrical fault detection; Fault detection; Flash memory; Hardware; Nonvolatile memory; Threshold voltage; Writing;
Conference_Titel :
Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
Conference_Location :
Lansing, MI
Print_ISBN :
0-7803-6475-9
DOI :
10.1109/MWSCAS.2000.951602
