DocumentCode :
375047
Title :
Some guidelines to enhance application-level robustness in linear computation
Author :
Alippi, Cesare
Author_Institution :
Dipt. Elettronica e Informazione, Politecnico di Milano, Milan, Italy
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
152
Abstract :
Application robustness i.e., the ability to provide a graceful degradation in performance when the algorithm solving the application is perturbed in its structural parameters, has an immediate effect on the design of a reliable circuit In fact, if the application is robust, we will experience a reduced impact of errors induced by faults affecting the application parameters. This situation is interesting for all those applications (e.g., embedded systems, image/signal processing on remote stations) for which an error-affected behaviour is acceptable as long as the error is kept within a priori defined bound. In this paper, we focus the attention on a linear computation by providing sensitivity tools to test the robustness degree of an application and off-fine techniques to improve it
Keywords :
fault tolerance; parameter estimation; redundancy; sensitivity analysis; signal processing; a priori defined bound; application parameters; application-level robustness; embedded systems; error-affected behaviour; image processing; linear computation; off-fine techniques; reliable circuit design; sensitivity tools; signal processing; structural parameters; Algorithm design and analysis; Circuit faults; Degradation; Embedded system; Guidelines; Robustness; Signal processing; Signal processing algorithms; Structural engineering; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
Conference_Location :
Lansing, MI
Print_ISBN :
0-7803-6475-9
Type :
conf
DOI :
10.1109/MWSCAS.2000.951608
Filename :
951608
Link To Document :
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