The study of phase noise measurement system of two-port device

In order to adapt the higher operating frequency of electronic systems, phase noise performance requirements of the system requirements are also increased. For semiconductor devices, phase noise measurement of amplifiers, the core component in systems, becomes particularly important. This article describes the noise measurement to traditional two-port devices. The traditional noise test bench using saturated mixers was carried out during the experiment. Experiments confirmed that the traditional way of measuring GaAs amplifier noise is enough, but for SiGe amplifier is not. This requires correlation technology in the data processing, or the transformation of the current measurement.