Title :
A leakage tolerant true single-phase clock dual-modulus prescaler scheme
Author :
Song Jia;Ziyi Wang;Shilin Yan;Yuan Wang
Author_Institution :
Key Laboratory of Microelectronic Devices and Circuits, Institute of Microelectronics, Peking University, 100871 Beijing, China
Abstract :
A new leakage-tolerant true single-phase clock dual-modulus prescaler based on a stage-merged scheme is presented. Leakage-restricting transistors are used to reduce the leakage currents at critical nodes and leakage-related malfunctions are eliminated at minimal cost in terms of speed, power and area overheads. An HSPICE simulation in a 40 nm process shows that the proposed divide-by-2/3 divider can effectively enhance robustness against leakage currents to extend the low frequency limit of the circuit over wide temperature and threshold voltage ranges. Additionally, the proposed design shows speed and power performance that is comparable to the performance levels of referenced designs.
Keywords :
"Leakage currents","Transistors","Performance evaluation","Clocks","Phase locked loops","Robustness","Frequency conversion"
Conference_Titel :
Microwave Conference (APMC), 2015 Asia-Pacific
Print_ISBN :
978-1-4799-8765-8
DOI :
10.1109/APMC.2015.7413500