DocumentCode :
3752624
Title :
Techniques for optoelectronic performance evaluation in InGaN-based light-emitting diodes (LEDs)
Author :
Jong-In Shim;Dong-Soo Shin
Author_Institution :
Dept. of Electronics, Hanyang Univ. ERICA campus, Ansan, Korea
fYear :
2015
Firstpage :
1
Lastpage :
2
Abstract :
To understand how each experimental parameter influences optoelectronic performances of InGaN-based LEDs, a method of systematic analysis that assesses the interrelations independently and quantitatively is absolutely necessary. Here, we introduce various characterization techniques to clarify the performance of LEDs and hidden severity of the detrimental effects, starting from the simple I-V measurement to more sophisticated temperature-dependent, spectroscopic, and LED efficiency measurements.
Keywords :
"Light emitting diodes","Temperature measurement","Photoconductivity","Quantum well devices","Capacitance-voltage characteristics","Power generation","Voltage measurement"
Publisher :
ieee
Conference_Titel :
Microoptics Conference (MOC), 2015 20th
Print_ISBN :
978-4-8634-8487-0
Type :
conf
DOI :
10.1109/MOC.2015.7416402
Filename :
7416402
Link To Document :
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