DocumentCode :
3752653
Title :
Dry etching for Germanium waveguides by using CHF3 inductively coupled plasma
Author :
Ahmad Syahrin Idris;Haisong Jiang;Kiichi Hamamoto
Author_Institution :
I-EggS, Kyushu Univ., 6-1, Kasuga-Koen, Kasuga, Fukuoka 816-8580, Japan
fYear :
2015
Firstpage :
1
Lastpage :
2
Abstract :
Dry etching for Ge waveguide has been researched by using inductively coupled plasma technique with CHF3 gas. It realizes a high selectivity of 5:1 against regular photoresist mask. Moreover, anisotropic etching without under-cut has been successfully realized with an etched siclewall angle of 85 degree with an etching rate of 190 nm/min.
Keywords :
"Iterative closest point algorithm","Silicon","Dry etching","Ions","Sulfur hexafluoride","Resists"
Publisher :
ieee
Conference_Titel :
Microoptics Conference (MOC), 2015 20th
Print_ISBN :
978-4-8634-8487-0
Type :
conf
DOI :
10.1109/MOC.2015.7416432
Filename :
7416432
Link To Document :
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