Markov process reliability model for photovoltaic module encapsulation failures

This paper presents Markov reliability model of Photovoltaic module encapsulation. The model includes all the possible failures associated with the operation of PV module. The same procedure of modeling can be extended to other parts of Photovoltaic systems. Firstly, failure causes are identified in details to develop the model, and then all the possible states of the encapsulation during the service are considered. Finally a complete Markov process is attained to assess the probability of each state and estimate the encapsulation mean time to failure, probability density function of the time to encapsulation failure, hazard and survival functions of PV module encapsulation.