Title :
Iterated calculation of global implications and recursive learning in combinational equivalence checking
Author :
Reda, Sherief ; Wahba, Ayman ; Salem, Ashraf ; Ghonaimy, Mohamed A.
Author_Institution :
Comput. & Syst. Eng. Dept., Ain Shams Univ., Cairo, Egypt
Abstract :
Boolean satisfiability and recursive learning have been used in solving the combinational equivalence-checking problem. In this paper, we extend the recursive learning procedure and integrate it with global implications calculated in an iterative way to reduce the time needed for the solution. We also propose a variable ordering scheme to minimize the number of iterations needed to calculate the implications
Keywords :
Boolean functions; automatic test pattern generation; combinational circuits; iterative methods; logic testing; ATPG technique; Boolean satisfiability; ISCAS-85 benchmark circuits; TEGUS; combinational equivalence checking; global implications; iterated calculation; recursive learning; variable ordering scheme; Automatic test pattern generation; Boolean functions; Circuit analysis; Circuit faults; Combinational circuits; Data structures; Decision trees; Performance analysis; Systems engineering and theory; Testing;
Conference_Titel :
Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
Conference_Location :
Lansing, MI
Print_ISBN :
0-7803-6475-9
DOI :
10.1109/MWSCAS.2000.952917