• DocumentCode
    3756085
  • Title

    In-Circuit Mutation-Based Automatic Correction of Certain Design Errors Using SAT Mechanisms

  • Author

    Payman Behnam;Bijan Alizadeh

  • Author_Institution
    Sch. of Electr. &
  • fYear
    2015
  • Firstpage
    199
  • Lastpage
    204
  • Abstract
    A large amount of time and effort must be spent to ensure the correctness of a digital design. Although many Computer Aided Design (CAD) solutions have been provided to enhance efficiency of existing debugging approaches, they are suffering from shortage of efficient automatic correction mechanisms. In this paper, we introduce an in-circuit mutation technique for correcting design bugs in digital designs. The aim of this work is reducing correction time by connecting primitive gates into inputs of 6-to-1 multiplexers in the place of potential bugs and utilizing satisfiability (SAT) engine for choosing the correct gates. The empirical results demonstrate that our proposed method can correct multiple bugs in a design by targeting gate replacements and wires exchanges efficiently. Average improvements in terms of the runtime and success rate in correction for combinational circuits in comparison with the latest the existing method are 3.4× and 11.5%, respectively. These results for sequential circuits are 3.8× and 17% respectively.
  • Keywords
    "Logic gates","Debugging","Wires","Computer bugs","Multiplexing","Engines","Inverters"
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2015 IEEE 24th Asian
  • Electronic_ISBN
    2377-5386
  • Type

    conf

  • DOI
    10.1109/ATS.2015.41
  • Filename
    7422259