DocumentCode
3756085
Title
In-Circuit Mutation-Based Automatic Correction of Certain Design Errors Using SAT Mechanisms
Author
Payman Behnam;Bijan Alizadeh
Author_Institution
Sch. of Electr. &
fYear
2015
Firstpage
199
Lastpage
204
Abstract
A large amount of time and effort must be spent to ensure the correctness of a digital design. Although many Computer Aided Design (CAD) solutions have been provided to enhance efficiency of existing debugging approaches, they are suffering from shortage of efficient automatic correction mechanisms. In this paper, we introduce an in-circuit mutation technique for correcting design bugs in digital designs. The aim of this work is reducing correction time by connecting primitive gates into inputs of 6-to-1 multiplexers in the place of potential bugs and utilizing satisfiability (SAT) engine for choosing the correct gates. The empirical results demonstrate that our proposed method can correct multiple bugs in a design by targeting gate replacements and wires exchanges efficiently. Average improvements in terms of the runtime and success rate in correction for combinational circuits in comparison with the latest the existing method are 3.4× and 11.5%, respectively. These results for sequential circuits are 3.8× and 17% respectively.
Keywords
"Logic gates","Debugging","Wires","Computer bugs","Multiplexing","Engines","Inverters"
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2015 IEEE 24th Asian
Electronic_ISBN
2377-5386
Type
conf
DOI
10.1109/ATS.2015.41
Filename
7422259
Link To Document