Poster Paper: Image Analysis for Automatic Characterization of Nanomaterials

Nowadays, the development of new technology depends strongly on nanomaterials study, which is carried out usually by microscopy techniques allowing the images acquisition of materials for their posterior characterization. When this feature extraction is performed through a human observer it can become slow, laborious and subjective, a situation that has generated great interest in image analysis because it has the potential to overcome this problematic. This paper proposes a system based on image analysis for automatic characterization of nanomaterials. The system consists of four stages: preprocessing, segmentation, feature extraction and validation. Results of applying these stages on images acquired with different microscopy techniques are shown. Finally, some challenges and opportunities in this area are discussed.