AFM system with a special quartz tuning fork probe

One or more probes will be used in the system of AFM, this paper mainly expounds a special shape quartz tuning fork probe whose tip stick on two parallel forks symmetrically and construct a simple AFM system by using the probe, Nano-positioning, Lock-in amplifier and so on. Then scan the outline topography and line width of a standard sample which contains a square of raster by using this system. Finally we compared the result with the result scanned by using commercial AFM and commercial scanning electron microscope (SEM). The result we measured in our experiment verified the feasibility of this system and make foundation for the next work.