Title :
Estimation of minority carrier lifetime in InGaN single junction solar cell
Author :
Md. Zahangir Alom;Md. Soyaeb Hasan;Md. Rafiqul Islam;Ibrahim Mustafa Mehedi;Abdullah M. Dobaie
Author_Institution :
Dept. of Electrical and Electronic Engineering (EEE), Khulna University of Engineering & Technology (KUET), Bangladesh
Abstract :
The parameters that influence the performance of solar cell, minority carrier lifetime is a crucial one. The increase of minority carrier lifetime results in higher conversion efficiency. Minority carrier lifetime is determined and analyzed for InGaN single junction solar cell at different excess carrier concentrations by considering the effect of radiative, Auger, Shockley-Read-Hall (SRH) and surface recombination. Since InGaN is a direct bandgap material it is found that radiative recombination is the dominating mechanism for determining the minority carrier lifetime.
Keywords :
"Radiative recombination","Photovoltaic cells","Charge carrier lifetime","Photonic band gap","Charge carrier processes","Junctions"
Conference_Titel :
Electrical & Electronic Engineering (ICEEE), 2015 International Conference on
Print_ISBN :
978-1-5090-1939-7
DOI :
10.1109/CEEE.2015.7428271