DocumentCode :
3758474
Title :
Estimation of minority carrier lifetime in InGaN single junction solar cell
Author :
Md. Zahangir Alom;Md. Soyaeb Hasan;Md. Rafiqul Islam;Ibrahim Mustafa Mehedi;Abdullah M. Dobaie
Author_Institution :
Dept. of Electrical and Electronic Engineering (EEE), Khulna University of Engineering & Technology (KUET), Bangladesh
fYear :
2015
Firstpage :
257
Lastpage :
260
Abstract :
The parameters that influence the performance of solar cell, minority carrier lifetime is a crucial one. The increase of minority carrier lifetime results in higher conversion efficiency. Minority carrier lifetime is determined and analyzed for InGaN single junction solar cell at different excess carrier concentrations by considering the effect of radiative, Auger, Shockley-Read-Hall (SRH) and surface recombination. Since InGaN is a direct bandgap material it is found that radiative recombination is the dominating mechanism for determining the minority carrier lifetime.
Keywords :
"Radiative recombination","Photovoltaic cells","Charge carrier lifetime","Photonic band gap","Charge carrier processes","Junctions"
Publisher :
ieee
Conference_Titel :
Electrical & Electronic Engineering (ICEEE), 2015 International Conference on
Print_ISBN :
978-1-5090-1939-7
Type :
conf
DOI :
10.1109/CEEE.2015.7428271
Filename :
7428271
Link To Document :
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