• DocumentCode
    3758658
  • Title

    Analysis on reason for high voltage silicon stack breakdown and device repaired

  • Author

    Hanmin Ye;Qianting Sun

  • Author_Institution
    Guilin University of Technology Guilin, China
  • fYear
    2015
  • Firstpage
    73
  • Lastpage
    76
  • Abstract
    This paper introduces the reason for the high voltage silicon stack broken down for the high voltage generator and the method of improvement is proposed. The machine operation shows that the method is correct.
  • Keywords
    "Decision support systems","Silicon","Insulators","Resistance","Generators","Limiting"
  • Publisher
    ieee
  • Conference_Titel
    Advanced Information Technology, Electronic and Automation Control Conference (IAEAC), 2015 IEEE
  • Print_ISBN
    978-1-4799-1979-6
  • Type

    conf

  • DOI
    10.1109/IAEAC.2015.7428521
  • Filename
    7428521
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3758658