High-resolution commercial CMOS image sensors as X-ray imagers and low-intensity particle beam monitors

In order to fulfil the need of cheap and high-resolution systems as radiation beam monitors we exploited the possibility of using commercial CMOS image sensors as X-rays and low-intensity particle beam monitors. The low cost of CMOS sensors make it possible to neglect the issue of radiation damage and consider the sensor somehow to be disposable after a given time. In perspective, the ability to combine custom data acquisition systems with commercially available CMOS sensors and suitable conversion layers will enable the development of advanced radiation imaging systems for several application fields. Up to now two different sensors have been mounted and tested aiming to act as beam monitors for two different beams, namely a pulsed proton beam and a collimated profiled beam coming from a table-top X-ray generator. The presentation will focus on the description of the architecture of the sensor systems and on the results of the experimental qualification.