• DocumentCode
    3759845
  • Title

    Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications

  • Author

    Gian-Franco Dalla Betta;Giovanni Batignani;Mohamed El Amine Benkechkache;Stefano Bettarini;Giulia Casarosa;Daniele Comotti;Lorenzo Fabris;Francesco Forti;Marco Grassi;Saida Latreche-Lassoued;Luca Lodola;Piero Malcovati;Massimo Manghisoni;Roberto Mendicino

  • Author_Institution
    TIFPAINFN, Italy
  • fYear
    2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    We report on the design and TCAD simulations of planar active-edge pixel sensors within the INFN PixFEL project. These devices are intended as one of the building blocks for the assembly of a multilayer, four-side buttable tile for X-ray imaging applications in future Free Electron Laser facilities. The requirements in terms of very wide dynamic range and tolerance to extremely high ionizing radiation doses call for high operation voltages. A comprehensive TCAD simulation study is presented, aimed at the best trade-offs between the minimization of the edge region size and the sensor breakdown voltage.
  • Keywords
    "Substrates","Photonics","Ionizing radiation sensors","Image edge detection","Detectors","Junctions"
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2014 IEEE
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2014.7431078
  • Filename
    7431078
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3759845