DocumentCode :
3759879
Title :
PERCIVAL: The design and characterisation of a CMOS image sensor for direct detection of low-energy X-rays
Author :
B. Marsh;D. Das;I. Sedgwick;R. Turchetta;M. Bayer;J. Correa;P. G?ttlicher;S. Lange;A. Marras;I. Shevyakov;S. Smoljanin;M. Viti;C. B. Wunderer;Q. Xia;M. Zimmer;G. Cautero;D. Giuressi;R. Menk;L. Stebel;H. Yousef;J. Marchal;U. Pedersen;N. Rees;N. Tartoni;H.
Author_Institution :
Rutherford Appleton Laboratory, Harwell Science and Innovation Campus, Didcot, OX11 0QX, UK
fYear :
2014
Firstpage :
1
Lastpage :
4
Abstract :
Free-Electron Lasers and Synchrotrons are rapidly increasing in brilliance. This has led a requirement of large dynamic range and high frame rate sensors that is now being fulfilled by the PERCVIAL CMOS imager for direct X-ray detection developed at Rutherford Appleton Laboratory. Utilising a lateral overflow pixel and back-side illumination, PERCIVAL simultaneously achieves low-noise single-photon detection and high full well up to 107 e-, all while maintaining a frame rate of 120Hz. PERCIVAL is currently in test structure stage, and will be produced in 2 Mpixel and 13 Mpixel “waferscale” variants in 2015.
Keywords :
"CMOS integrated circuits","Capacitors","X-rays","Dynamic range","Standards","Sensor phenomena and characterization"
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2014 IEEE
Type :
conf
DOI :
10.1109/NSSMIC.2014.7431113
Filename :
7431113
Link To Document :
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