• DocumentCode
    3760071
  • Title

    DFT guidance through RTL test justification and propagation analysis

  • Author

    Y. Makris;A. Orailoglu

  • Author_Institution
    Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
  • fYear
    1998
  • Firstpage
    668
  • Lastpage
    677
  • Abstract
    We introduce a formal mechanism for capturing test justification and propagation related behavior of blocks. Based on the identified test translation behavior, an RTL testability analysis methodology for hierarchical designs is derived. An algorithm for pinpointing the local-to-global test translation controllability and observability bottlenecks is presented. The analysis results are validated through an ATPG-based experimental flow and the applicability of the scheme for addressing test challenges in large designs by guiding DFT decisions is discussed.
  • Keywords
    "Circuit testing","Logic testing","Design for testability","Computer science","Reliability engineering","System testing","Design methodology","Controllability","Observability","Silicon"
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743211
  • Filename
    743211