DocumentCode
3760071
Title
DFT guidance through RTL test justification and propagation analysis
Author
Y. Makris;A. Orailoglu
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fYear
1998
Firstpage
668
Lastpage
677
Abstract
We introduce a formal mechanism for capturing test justification and propagation related behavior of blocks. Based on the identified test translation behavior, an RTL testability analysis methodology for hierarchical designs is derived. An algorithm for pinpointing the local-to-global test translation controllability and observability bottlenecks is presented. The analysis results are validated through an ATPG-based experimental flow and the applicability of the scheme for addressing test challenges in large designs by guiding DFT decisions is discussed.
Keywords
"Circuit testing","Logic testing","Design for testability","Computer science","Reliability engineering","System testing","Design methodology","Controllability","Observability","Silicon"
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743211
Filename
743211
Link To Document