Title :
Power efficiency of GaSb based 2.0 μm diode lasers
Author :
Rattunde, M. ; Mermelstein, C. ; Schmitz, J. ; Kiefer, R. ; Pletschen, W. ; Fuchs, F. ; Walther, M. ; Wagner, J.
Author_Institution :
Fraunhofer-Inst. fur Angewandte Festkorperphys., Freiburg, Germany
Abstract :
There is an increasing interest in room-temperature diode lasers emitting in the mid infrared wavelength region around 2 μm not only for trace gas analysis, but also for high power applications such as material processing and laser surgery. For the latter application the key issue is a high power conversion efficiency of the diode lasers, which is closely linked to a good thermal management, in order to obtain high output powers. We have realized GaInAsSb/AlGaAsSb QW diode lasers with an emission wavelength between 1.73 and 2.35 μm. The samples were grown by molecular beam epitaxy on (100) GaSb:Te n-type substrates. The active region consists of three compressively strained 10 nm wide GaInAsSb QWs separated by 20 nm wide lattice matched AlGaAsSb barriers. The QW region is surrounded by 400 nm thick AlGaAsSb separate confinement layers, followed by 2 μm thick AlGaAsSb n-doped and p-doped cladding layers. Ridge waveguide lasers made out of these samples were used to derive the standard laser parameters
Keywords :
III-V semiconductors; gallium compounds; quantum well lasers; thermal resistance; waveguide lasers; 2 micron; GaInAsSb-AlGaAsSb; GaSb; Gaussian shape; QW diode lasers; beam quality; broad-area laser; compressively strained QW; high power application; lattice matched barriers; mid infrared lasers; molecular beam epitaxy; multimode behavior; power efficiency; ridge waveguide lasers; room-temperature diode lasers; separate confinement layers; thermal resistance; Diode lasers; Energy management; Laser surgery; Materials processing; Molecular beam epitaxial growth; Power conversion; Power generation; Substrates; Thermal management; Waveguide lasers;
Conference_Titel :
Lasers and Electro-Optics Society, 2001. LEOS 2001. The 14th Annual Meeting of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-7105-4
DOI :
10.1109/LEOS.2001.968911