Title :
GaInNAs/GaAs edge emitting lasers for the 1.3 to 1.5 μm wavelength range
Author :
Fischer, M. ; Forchel, A. ; Gollub, D. ; Reinhardt, M.
Author_Institution :
Inst. fur Technische Phys., Wurzburg Univ., Germany
Abstract :
GaInAsN/AlGaAs laser structures have been investigated in the telecommunication wavelength range from 1.3 μm to 1.5 μm. The separate confinement heterostructure laser layers have been grown by molecular beam epitaxy with an RF nitrogen source. Broad area lasers at 1.3 μm have threshold current densities of 780 A/cm2. Ridge waveguide lasers with threshold currents of 21 mA and external efficiencies of 0.5 W/A have been realized. Using metal gratings along both sides of the ridge loss coupled distributed feedback lasers have been obtained with side mode suppression ratios above 40 dB. When the N-fraction is increased to about 5% the emission wavelength of the lasers is shifted to 1.5 μm. GaInNAs laser data at 1.4 μm and 1.5 μm are reported
Keywords :
III-V semiconductors; distributed feedback lasers; gallium arsenide; gallium compounds; indium compounds; laser transitions; molecular beam epitaxial growth; optical communication equipment; quantum well lasers; ridge waveguides; waveguide lasers; 1.3 to 1.5 micron; 21 mA; DFB lasers; GaInAsN-AlGaAs; GaInNAs laser data; GaInNAs/GaAs edge emitting lasers; RF nitrogen source; broad area lasers; emission wavelength; laser structures; metal gratings; molecular beam epitaxy; quantum well lasers; ridge loss coupled distributed feedback lasers; ridge waveguide lasers; separate confinement heterostructure laser layers; side mode suppression ratios; telecommunication wavelength; threshold current densities; threshold currents; Distributed feedback devices; Gallium arsenide; Gratings; Laser feedback; Laser modes; Molecular beam epitaxial growth; Nitrogen; Radio frequency; Threshold current; Waveguide lasers;
Conference_Titel :
Lasers and Electro-Optics Society, 2001. LEOS 2001. The 14th Annual Meeting of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-7105-4
DOI :
10.1109/LEOS.2001.968968