• DocumentCode
    3760650
  • Title

    A study of automatic measuring circuit suitable for very small phase difference measurement

  • Author

    Takuro Noguchi;Sumio Fukai;Ichihiko Toyoda;Yohei Ishikawa;Akio Shimizu

  • Author_Institution
    Graduate School of Science and Engineering, Saga University, Honjo-machi 1, Saga-shi, Japan
  • fYear
    2015
  • Firstpage
    323
  • Lastpage
    326
  • Abstract
    In this paper, we propose an automatic measuring circuit suitable for the simplified very small phase difference measurement circuit. The proposed circuit consists of a J-FET, envelop detection circuit and microcontroller (Arduino). The experiment of automatic phase difference measurement is performed using proposed circuit and automatic amplitude adjustment algorithm. As a result, the error rate of phase difference measurement is ±0.03% or less at phase difference up to about 0.64 deg.
  • Keywords
    "Phase measurement","Electrical resistance measurement","Measurement uncertainty","Signal processing algorithms","Loss measurement","Band-pass filters","Error analysis"
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Signal Processing and Communication Systems (ISPACS), 2015 International Symposium on
  • Type

    conf

  • DOI
    10.1109/ISPACS.2015.7432789
  • Filename
    7432789
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3760650