DocumentCode :
3761700
Title :
SRAM cell with improved stability and reduced leakage current for subthreshold region of operation
Author :
P Sreelakshmi;Kirti S. Pande;N. S. Murty
Author_Institution :
Department of Electronics and Communication Engineering, Amrita School of Engineering, Bengaluru Campus, Amrita Vishwa Vidyapeetham (University), India
fYear :
2015
Firstpage :
1
Lastpage :
5
Abstract :
In this paper, a Modified Differential 8T SRAM cell is proposed for subthreshold region of operation. Forward Body biasing technique is used to improve the drivability of transistors and sleep transistor logic is used to reduce the leakage current in standby mode. The proposed design is implemented with 45 nm CMOS technology and is simulated using Cadence Virtuoso Simulator. At 0.5 V supply voltage, the read SNM and write SNM are 98 mV and 112 mV respectively and these are 32% and 21% higher than there reported in literature. The leakage current and power consumption of the cell are 3.26 fA and 1.63 fW respectively.
Keywords :
"Transistors","Threshold voltage","Circuit stability","SRAM cells","Stability analysis","Leakage currents"
Publisher :
ieee
Conference_Titel :
Computational Intelligence and Computing Research (ICCIC), 2015 IEEE International Conference on
Print_ISBN :
978-1-4799-7848-9
Type :
conf
DOI :
10.1109/ICCIC.2015.7435750
Filename :
7435750
Link To Document :
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