DocumentCode
3762351
Title
Solid-State-Drive qualification and reliability strategy
Author
Todd A. Marquart
Author_Institution
Boise, ID, USA
fYear
2015
Firstpage
3
Lastpage
6
Abstract
As NAND flash memories have scaled the margin between NAND capability and system requirements have been significantly reduced. Understanding Solid-State-Drive (SSD) reliability and qualification requirements has become more critical since these impact the NAND flash design tradeoffs. Unrealistically high expectations result in excessive margin that could have been used in other areas, while too low of a requirement puts the system at risk for excessive field failure. The reliability and qualification requirements for SSDs will be reviewed and discussed in order to give an overview of what constitutes an effective qualification/reliability strategy for SSDs.
Keywords
"Acceleration","Qualifications","Reliability engineering","Failure analysis","Temperature distribution"
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop (IIRW), 2015 IEEE International
Print_ISBN
978-1-4673-7395-1
Electronic_ISBN
2374-8036
Type
conf
DOI
10.1109/IIRW.2015.7437056
Filename
7437056
Link To Document