• DocumentCode
    3762351
  • Title

    Solid-State-Drive qualification and reliability strategy

  • Author

    Todd A. Marquart

  • Author_Institution
    Boise, ID, USA
  • fYear
    2015
  • Firstpage
    3
  • Lastpage
    6
  • Abstract
    As NAND flash memories have scaled the margin between NAND capability and system requirements have been significantly reduced. Understanding Solid-State-Drive (SSD) reliability and qualification requirements has become more critical since these impact the NAND flash design tradeoffs. Unrealistically high expectations result in excessive margin that could have been used in other areas, while too low of a requirement puts the system at risk for excessive field failure. The reliability and qualification requirements for SSDs will be reviewed and discussed in order to give an overview of what constitutes an effective qualification/reliability strategy for SSDs.
  • Keywords
    "Acceleration","Qualifications","Reliability engineering","Failure analysis","Temperature distribution"
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop (IIRW), 2015 IEEE International
  • Print_ISBN
    978-1-4673-7395-1
  • Electronic_ISBN
    2374-8036
  • Type

    conf

  • DOI
    10.1109/IIRW.2015.7437056
  • Filename
    7437056