Discussion group summaries [multiple presentation summaries]

fYear

2015

Firstpage

162

Lastpage

174

Keywords

"Reliability","Logic gates","Tutorials","Heating","Hot carriers","Degradation","Resilience"

Publisher

ieee

Conference_Titel

Integrated Reliability Workshop (IIRW), 2015 IEEE International

Print_ISBN

978-1-4673-7395-1

Electronic_ISBN

2374-8036

Type

conf

DOI

10.1109/IIRW.2015.7437098

Filename

7437098

Link To Document