Title :
Delay and yield of CNFET-based circuits in the presence of variations
Author :
Malgorzata Chrzanowska-Jeske
Author_Institution :
Electrical and Computer Engineering Department, Portland State University, Portland, OR
Abstract :
The aggressive scaling of CMOS circuits is approaching the atomic and quantum physical limits [1], and therefore extensive research is being conducted on devices made with III-V and II-VI semiconductors, and with more exotic materials like grapheme, and various nanotubes.
Conference_Titel :
Nanotechnology Materials and Devices Conference (NMDC), 2015 IEEE
DOI :
10.1109/NMDC.2015.7439255
