DocumentCode :
3763874
Title :
Optimal design of 6T SRAM bitcells for ultra low-voltage operation
Author :
Amgad A. Ghonem;Mostafa F. Farid;Mohamed Dessouky
Author_Institution :
Integrated Circuits laboratory Ain-Shams University
fYear :
2015
Firstpage :
454
Lastpage :
457
Abstract :
Embedded SRAM is involved in many low-energy applications, e.g. stand-alone wireless sensor nodes. SRAMs have the highest energy contribution in such applications. Energy consumption can be decreased by lowering the supply voltage. However, SRAM bitcells impose a lower bound on the supply voltage. In this paper, ultra low-voltage SRAM design optimization is investigated in a 65nm technology. It is shown that the bitcell design at low-voltages is fairly different than that at nominal ones. Using aggressive write/read-assist techniques, the well-known 6-transistor bitcell can operate down to 0.5V. Five different optimized design options are compared. Write-optimized bitcells are shown to be optimal for ultra low-voltage operation.
Keywords :
"Random access memory","MOS devices","Transistors","Boosting","Leakage currents","Measurement","Topology"
Publisher :
ieee
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2015 IEEE International Conference on
Type :
conf
DOI :
10.1109/ICECS.2015.7440346
Filename :
7440346
Link To Document :
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