Title :
Impact of memristor switching noise in a neuromorphic crossbar
Author :
Chris Yakopcic;Tarek M. Taha;Guru Subramanyam;Robinson E. Pino
Author_Institution :
Department of Electrical and Computer Engineering, University of Dayton, Dayton, OH, USA
fDate :
6/1/2015 12:00:00 AM
Abstract :
Many existing memristor models have a direct relationship between resistance change and the voltage pulse applied. However, this results in a memristor model that can be tuned nearly to a floating point value if a small enough voltage pulse is applied. This paper discusses how noise can be added to the dynamic resistive switching component of a memristor model in SPICE. The proposed memristor model has a tunable degree of stochastic behavior during switching. Therefore, each time an identical voltage pulse is applied to a memristor device, a varying amount of resistance change will occur. This provides a much more realistic model of memristor behavior. Furthermore, this model is used in a neuromorphic circuit simulation to show that stochastic memristor devices can be trained according to a learning algorithm. The amount of switching noise in the memristors was varied to see what impact this may have on a neuromorphic circuit.
Keywords :
"Memristors","Mathematical model","Switches","Stochastic processes","Resistance","Integrated circuit modeling","Neuromorphics"
Conference_Titel :
Aerospace and Electronics Conference (NAECON), 2015 National
Electronic_ISBN :
2379-2027
DOI :
10.1109/NAECON.2015.7443090