• DocumentCode
    3764676
  • Title

    Weighted cosine distance features for speaker verification

  • Author

    C. Santhosh Kumar;Kuruvachan K. George;K. I. Ramachandran;Ashish Panda

  • Author_Institution
    Machine Intelligence Research Lab., Amrita Vishwa Vidyapeetham, Coimbatore, India
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Cosine distance similarities with a set of reference speakers, cosine distance features (CDF), with a backend support vector machine classifier (CDF-SVM) have been explored in our earlier studies for improving the performance of speaker verification systems. Subsequently, we also investigated on its effectiveness in improving the noise robustness of speaker verification systems. In this work, we study how the performance of CDF-SVM systems can be further improved by weighting the feature vectors using latent semantic information (LSI) technique. We use mel frequency cepstral coefficients (MFCC), power normalized cepstral coefficients (PNCC), or delta spectral cepstral coefficients (DSCC) for deriving CDF. Experimental results on the female part of short2-short3 trials of NIST speaker recognition evaluation dataset show that the proposed weighted CDF-SVM system outperforms the baseline i-vector with cosine distance scoring (i-CDS), i-vector with a backend SVM classifier (i-SVM) and CDF-SVM systems. Finally, we fused the weighted CDF-SVM with i-CDS and the performance of the combined system was evaluated under different stationary and non-stationary additive noise test conditions. It was seen that the noise robustness of the fused weighted CDF-SVM+i-CDS system is significantly better than the individual systems and the fused CDF-SVM+i-CDS of our earlier work in both clean and noisy test environments except for the zero SNR level condition of certain noises.
  • Keywords
    "Support vector machines","Mel frequency cepstral coefficient","Training","Speech","Kernel","Noise robustness"
  • Publisher
    ieee
  • Conference_Titel
    India Conference (INDICON), 2015 Annual IEEE
  • Electronic_ISBN
    2325-9418
  • Type

    conf

  • DOI
    10.1109/INDICON.2015.7443376
  • Filename
    7443376